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School of Reliability and Systems Engineering, Beihang University, Xueyuan Road No.37, Haidian District, Beijing, People's Republic of China
Ningbo Institution of Technology (NIT), Beihang University, Ningbo 315832, People's Republic of China
[ "Fei Gao received BS and PhD degrees in mechanical engineering from Xi'an Jiaotong University, Xi'an, China, in 2013 and 2018, respectively. He is currently an Associate Professor with the School of Reliability and Systems Engineering, Beihang University, Beijing, China. His research interests include structural health monitoring (SHM), nondestructive testing (NDT), and guided wave propagation." ]
[ "Yishu Chen received a BS degree in reliability and safety engineering from Beihang University, Beijing, China, in 2022. He is currently pursuing a PhD degree in control science and engineering at Beihang University, Beijing, China. His research interests include structural health monitoring (SHM), nondestructive testing (NDT), and digital twin for fault diagnosis." ]
[ "Jing Lin (Senior Member, IEEE) received BS, MS and PhD degrees in mechanical engineering from Xi'an Jiaotong University, Xi'an, China, in 1993, 1996 and 1999, respectively. From 2009 to 2018, he was a Professor with the School of Mechanical Engineering, Xi'an Jiaotong University, Xi'an, China. He is currently the Dean of the School of Reliability and Systems Engineering, Beihang University, Beijing, China." ]
[ "Yinmin Zhu received a BS degree in safety engineering from Beihang University, Beijing, China, in 2024. He is currently pursuing a PhD degree in electronic information engineering with Beihang University, Beijing, China. His research interests include structural health monitoring (SHM), nondestructive testing (NDT), and intelligent signal processing technology." ]
[ "Yonghao Miao received BS degree in mechanical engineering and automation from the Wuhan University of Technology, Wuhan, China, in 2013, and a PhD degree in mechanical engineering from Xi'an Jiaotong University, Xi'an, China, in 2018. He is currently an Associate Professor with the School of Reliability and Systems Engineering, Beihang University, Beijing, China." ]
[ "Jinghui Tian received a BS degree in measurement and control technology and instrumentation from Henan Polytechnic University, Jiaozuo, China, in 2018, and a PhD degree in mechanical design and theory from Yanshan University, Qinhuangdao, China, in 2024. He was a Visiting PhD Student with the Department of Mechanical Engineering, Politecnico di Milano, Milan, Italy, from 2022 to 2023. He is currently a Postdoctoral Research Fellow with the Ningbo Institute of Technology, Beihang University, Ningbo, China. His research interests include transfer learning, information fusion, machinery condition monitoring, and intelligent fault diagnosis." ]
Received:26 December 2025,
Revised:2026-03-14,
Accepted:18 March 2026,
Online First:31 March 2026,
Published:2026-06
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Fei Gao, Yishu Chen, Jing Lin, et al. 梅尔频谱图驱动的深度学习框架:用于丝材电弧增材制造中基于声发射的制造监测[J]. 可靠性科学与工程学报(英文), 2026, 2: 025301.
Fei Gao, Yishu Chen, Jing Lin, et al. Mel spectrogram–driven deep learning framework for acoustic emission-based manufacturing monitoring in wire arc additive manufacturing[J]. Journal of Reliability Science and Engineering, 2026, 2: 025301.
Fei Gao, Yishu Chen, Jing Lin, et al. 梅尔频谱图驱动的深度学习框架:用于丝材电弧增材制造中基于声发射的制造监测[J]. 可靠性科学与工程学报(英文), 2026, 2: 025301. DOI: 10.1088/3050-2454/ae5498.
Fei Gao, Yishu Chen, Jing Lin, et al. Mel spectrogram–driven deep learning framework for acoustic emission-based manufacturing monitoring in wire arc additive manufacturing[J]. Journal of Reliability Science and Engineering, 2026, 2: 025301. DOI: 10.1088/3050-2454/ae5498.
声发射技术在丝材电弧增材制造(WAAM)的原位监测与缺陷诊断中展现出巨大潜力。然而,WAAM过程中产生的AE信号受到电弧放电噪声的严重污染,导致难以直接从原始数据中提取与缺陷相关的特征。本研究提出一种基于梅尔频谱图的深度学习框架,用于WAAM的高效健康监测。该方法引入了一种增强的时频表示策略,能够在WAAM工艺固有的高噪声条件下更有效地捕捉缺陷相关特征。通过利用梅尔频谱图表示,该框架增强了对信息丰富的低频部分的表示,同时抑制了高频噪声,从而提升了特征的可解释性和鲁棒性。研究采用卷积神经网络和视觉变换器模型进行缺陷分类及性能基准测试。实验结果表明,所提方法在显著降低计算成本的同时实现了较高的诊断精度,优于传统的基于短时傅里叶变换的方法。研究结果证实,梅尔频谱图表示为WAAM的健康监测提供了一种更高效且泛化能力更强的解决方案。
Acoustic emission shows great potential for
in-situ
monitoring and defect diagnosis in wire arc additive manufacturing (WAAM). However
the AE signal produced during WAAM is heavily contaminated by arc discharge noise
making it difficult to directly extract defect-related features from raw data. This study proposes a Mel spectrogram–based deep learning framework for efficient WAAM health monitoring. The method introduces an enhanced time–frequency representation strategy that captures defect-related features more effectively under the high-noise conditions inherent in WAAM processes. By leveraging Mel spectrogram representations
the framework emphasizes informative low-frequency components while suppressing high-frequency noise
thereby improving feature interpretability and robustness. Convolutional neural network and vision transformer models are employed for defect classification and performance benchmarking. Experimental results demonstrate that the proposed approach achieves high diagnostic
accuracy with substantially reduced computational cost
outperforming conventional short-time Fourier transform-based methods. The findings confirm that Mel spectrogram representations offer a more efficient and generalizable solution for health monitoring in WAAM.
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