[ "Xinggao Zhu is the first author of this paper. He received a PhD from the Beijing Institute of Technology, Beijing, China. He is currently a senior engineer at the China Astronautics Standards Institute. His research interest is mechanical reliability engineering." ]

[ "Pengfei Liu is the corresponding author of this paper. He received a PhD from the Tiangong University, Tianjin, China. He is currently an engineer at the China Astronautics Standards Institute. His research interest is mechanical system dynamics." ]

[ "Jiahui Luan is currently a researcher at the China Astronautics Standards Institute. His research interest is mechanical reliability engineering." ]

[ "Haibo Mi is currently a senior engineer at the China Astronautics Standards Institute. His research interest is reliability testing technology." ]

[ "Hao Dong graduated from Yanshan University. He is currently an engineer at the China Astronautics Standards Institute. His research interest is fault diagnosis and health management of intelligent devices." ]

[ "Hao Chen is currently a senior engineer at the China Astronautics Standards Institute. His research interest is reliability and EMC test simulation." ]

[ "Zhaopeng Xue received Master's degree in Nanjing University of Aeronautics and Astronautics, Nanjing, China. He is currently an engineer at the China Astronautics Standards Institute. His research interest is mechanical reliability engineering." ]

[ "Haipeng Wen graduated from the University of Science and Technology Beijing, China. He is currently employed as an engineer at the China Astronautics Standards Institute. His research focuses on the field of multiphysics coupling simulation." ]

[ "Yongde Dai received his Master's degree from the China University of Geosciences, Beijing, China. He is currently an engineer at the China Astronautics Standards Institute. His research interest is mechanical reliability engineering." ]